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Hioki
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Bare Board Testing
Double-sided Board Tester with Maximum Measurement Speed of 0.012s/Step The 1270 and 1271 are fixtureless, dual-sided, bare board testers that provide superior cost performance. Using a total of four arms, two in front and two in back, it is capable of simultaneously testing both sides of an optional board, and is available with a4-terminal resistance measurement function that enables measurement of very small resistances in IVH or through holes. Testable board dimensions (1270): 50 × 50 to 400 × 330 mm Testable board dimensions (1271): 50 × 70 to 610 × 510 mm
Category:
Bare Board Testing
100 Steps/Second Ultra-High Speed Board Pattern Inspection System The 1116 Series are high-speed substrate testers that use capacitance testing to greatly reduce the number of testing steps and time required compared to the continuity testing method. They support ordinary bare boards to high-density BGA, CSP, or MCM packages, as well as flexible boards. 1116-71 (Offline type) 1116-72 (Single-robot transport) 1116-73 (Offline, with 1945-21 and 1945-22) 1116-74 (Single-robot transport, with 1945-21 and 1945-22) 1116-75 (Double-robot transport, with 1945-21 and 1945-22) *1945-21: Coaxial Downward Illumination Unit for R arm *1945-22: Coaxial Downward Illumination Unit for L arm Testable board dimensions: 50 × 50 to 610 × 510 mm (*1116-75: to 280 × 510 mm)
Category:
Populated Board Testing
Detection of IC lead pseudo-contact (poor contact) states • High-speed testing at up to 0.025 sec./step (1240-01, 1240-03) • Detection of IC lead float and pseudo-contact states • Support for active testing (optional feature) • High-precision probing • Large testing area of 510 × 460 mm (1240-01, 1240-02) • Standard transport capability • Automatic alignment function and simple visual test function